Sem/eds analysis laboratories in Chelmsford? SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Find a few more details on Microvision Labs.
Approach: MicroVision Labs’ staff consulted with the client, and determined that, unfortunately, there could be a number of potential sources of a white material. Even before the bottle with the suspended material arrived, it was determined that there was less than 50 mL of water remaining, and likely less than a gram of material suspended in the water. The client was aware that this material could represent precipitated minerals from the source water, a polymer residue from the bottles, some form of biological tissue that might have formed despite sterilization procedures, or could very well represent some completely unforeseen foreign material. The issue facing the client is how to have the material tested, as most tests that they might request for one or the other of these known potential sources would destroy or alter the sample. Choosing a test was therefore something of a gamble, because if they tested for calcium (mineral precipitate) and it came up negative – that didn’t actually tell them what the powder was, just that it didn’t have any calcium. Based on this conversation, the non-destructive, specialized testing at MicroVision Laboratories was chosen as the best choice.
Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin.
What is your standard turnaround time (TAT) and can it be expedited? Our standard TAT is 5 to 10 business days. We can provide faster TATs on request with the following surcharges: – Same day to 24 hour rush is 100% surcharge – 2 day rush is 75% surcharge – 3 day rush is 50% surcharge – 4 day rush is 25% surcharge Rush requests must have prior approval otherwise we cannot guarantee turnaround times.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
MicroVision Laboratories, Inc. has been providing businesses, consultants and other testing laboratories with expert microscopy and analytical services since 2003. Our client base covers a broad spectrum of industries including semi-conductors, aerospace, electronics, biomedical, ceramics, optics, pharmaceuticals, mineralogy, metallurgy, thin films, environmental, membranes filtration and industrial hygiene. Read more details at microvisionlabs.com.